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J. Phys. Soc. Jpn. 78 (2009) 033602 (3 pages)  |Previous Article| |Next Article|  |Table of Contents|
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Substantial Contribution to a Cantilever Resonance Frequency Shift in Magnetic Resonance Force Microscopy

Kohsuke Inomata1,2, Shigenori Tsuji2,3, Yohsuke Yoshinari2,3, Hyun Soon Park4, and Daisuke Shindo4

1Graduate School of Engineering, Kyoto University, Kyoto 615-8510
2CREST, JST, Kawaguchi, Saitama 332-0012
3Advanced Technology Division, JEOL Ltd., Akishima, Tokyo 196-8558
4Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577

(Received November 6, 2008; Accepted December 22, 2008; Published February 25, 2009)

We report a cantilever resonance frequency shift due to the magnetic resonance force gradient in magnetic resonance force microscopy. Our experimental results obtained for a phantom sample of diphenylpicrylhydrazil (DPPH) at T=14 K can be quantitatively understood with the magnetic force gradient containing the first derivative of spin magnetization. This substantial contribution should be explicitly treated when calculating an equipment function and estimating the number of spins through the deconvolution process for image restoration. ©2009 The Physical Society of Japan

KEYWORDS: MRFM, ESR, cantilever, FM detection
URL: http://jpsj.ipap.jp/link?JPSJ/78/033602/
DOI: 10.1143/JPSJ.78.033602


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