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J. Phys. Soc. Jpn. 59 (1990) pp. 1853-1867  |Next Article|  |Table of Contents|
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Exciton Quantization and Polariton Interference in Thin Films: Comparison of Different Approaches

Kikuo Cho, Andrea D'andrea,† Rodolfo Del Sole†† and Hajime Ishihara

Faculty of Engineering Science, Osaka University, Toyonaka, 560
†Istituto di Metodologie Avanzate lnorganiche del CNR, Area della Ricerca di Roma, I-00016 Monterotondo Stazione (RM), Italy
††Dipartimento di Fisica, II Universita' di Roma “Tor Vergata” v. E. Carnevale, I-00173 Roma, Italy

(Received September 4, 1989)

In search for an accurate and convenient method to calculate optical properties of excitons in thin films as a non-local response, a comparison is made among the different frameworks available for different regions of film thickness (d). A detailed discussion is given about the multi-mode nature of polariton interference in optical spectra. The exciton levels in GaAs films with d>2.5aB are shown to follow approximately the center-of-mass quantization. The measured reflectance spectra for GaAs films with d≥4800 A are reasonably interpreted in terms of three-branch polaritons arising from light- and heavy-mass excitons. ©1990 The Physical Society of Japan

URL: http://jpsj.ipap.jp/link?JPSJ/59/1853/
DOI: 10.1143/JPSJ.59.1853


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